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Journal of Applied Physics : Subwavelength imaging based on frequency scanning

By Stanislav Maslovski, Pekka Alitalo, and Sergei Tretyakov

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Book Id: WPLBN0002169322
Format Type: PDF eBook :
File Size: Serial Publication
Reproduction Date: 19 November 2008

Title: Journal of Applied Physics : Subwavelength imaging based on frequency scanning  
Author: Stanislav Maslovski, Pekka Alitalo, and Sergei Tretyakov
Volume: Issue : November 2008
Language: English
Subject: Science, Physics, Natural Science
Collections: Periodicals: Journal and Magazine Collection, Journal of Applied Physics Collection
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Publication Date:
Publisher: American Institute of Physics

Description
Description: A new principle of subwavelength imaging based on frequency scanning is considered. It is shown that it is possible to reconstruct the spatial profile of an external field exciting an array (or coupled arrays) of subwavelength-sized resonant particles with a frequency scan over the whole band of resonating array modes. During the scan it is enough to measure and store the values of the near field at one or at most two points. After the scan the distribution of the near field can be reconstructed with simple postprocessing. The proposed near-field microscope has no moving parts.

 
 



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